Temperature Forcing System – AES Temperature Shock Test Machine

Suitable for IC Testing of Semiconductor chips, Flash Memory Flash/EMMC, PCB Circuit Boards, Optical Communications, Electronics Industry

The Temperature Forcing System – AES Temperature Shock Test Machine(jet flow high and low temperature impact tester)  provides precise and rapid ambient temperature for chips, modules, integrated circuit boards, electronic components, etc. It is an indispensable instrument for electrical performance test, failure analysis, and reliability evaluation of products. Compared to traditional thermostats, our system possesses several remarkable features:

• Temperature range: -120°C to +300°C
• Rapid heating and cooling rates, achieving 150°C to -55°C in less than 10 seconds
• Maximum atmospheric discharge: 30m/h
• Real-time monitoring of IC temperatures with closed-loop feedback for precise adjustments
• Controllable rise and fall times, with programmable, manual, and remote control operation
• Test conditions: ambient temperature 20°C, 30m/h 5Bar, using compressed air or ammonia gas

Moreover, our 100m/h gas flow rapid impact tester can be tailored to meet the demands of large-scale testing requirements. Experience unparalleled efficiency and accuracy with our Temperature Forcing System – AES Temperature Shock Test Machine.